Displaying ISBN 978-0-8176-4592-2
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Data Modeling for Metrology and Testing in Measurement Science | |
| Authors: | Franco Pavese et al | |
| Publisher | Birkhäuser | |
| Copyright | 2009 | |
| ISBN(Online) | 978-0-8176-4804-6 | |
| ISBN(Print) | 978-0-8176-4592-2 | |
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- 978-0-8176-4592-2
- CD and DVD copyright US_2008.pdf
- READMEFIRST.txt
- DVDcontents_Pavese_Forbes_Birkhauser.pdf
- listing.txt
- A.1.2 Reports and Guidelines
- A.1.4 NIST Engineering Statistical Handbook
- A.1.5 NRC Monte Carlo modeling of randomness
- A.1.6 Statistical software
- Parent book info
- A.1.1 Additional materials fo the Chapters
- A.1.3 Measurement Software
