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Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

© 2008

Hard cover - Print (ISBN: 978-0-387-74746-0)

Electronic (ISBN: 978-0-387-74747-7)

Soft cover - Print (ISBN: 978-1-4419-4513-6)

View this book on SpringerLink

Download Product Archive File - 978-0-387-74747-7 Download product archive files for 978-0-387-74747-7