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Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

© 2010

Hard cover - Print (ISBN: 978-1-4419-0937-4)

Electronic (ISBN: 978-1-4419-0938-1)

Soft cover - Print (ISBN: 978-1-4899-8314-5)

View this book on SpringerLink

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