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Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

© 2012

Hard cover - Print (ISBN: 978-1-4471-2469-6)

Electronic (ISBN: 978-1-4471-2470-2)

Soft cover - Print (ISBN: 978-1-4471-6068-7)

View this book on SpringerLink

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