Results

Book cover

Analog IC Reliability in Nanometer CMOS

© 2013

Hard cover - Print (ISBN: 978-1-4614-6162-3)

Electronic (ISBN: 978-1-4614-6163-0)

Soft cover - Print (ISBN: 978-1-4899-8630-6)

View this book on SpringerLink

Download Product Archive File - 978-1-4614-6163-0 Download product archive files for 978-1-4614-6163-0