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Book cover

Nanometer Variation-Tolerant SRAM

Circuits and Statistical Design for Yield

© 2013

Hard cover - Print (ISBN: 978-1-4614-1748-4)

Soft cover - Print (ISBN: 978-1-4939-0220-0)

Electronic (ISBN: 978-1-4614-1749-1)

View this book on SpringerLink