Extra Materials Archive

Book cover

Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings

© 2002

Soft cover - Print (ISBN: 978-3-540-44011-6)

Electronic (ISBN: 978-3-540-70659-5)

View this book on SpringerLink

Extra Materials File 978-3-540-70659-5