Extra Materials Archive

Book cover

Fundamentals of Bias Temperature Instability in MOS Transistors

Characterization Methods, Process and Materials Impact, DC and AC Modeling

© 2016

Hard cover - Print (ISBN: 978-81-322-2507-2)

Soft cover - Print (ISBN: 978-81-322-3424-1)

Electronic (ISBN: 978-81-322-2508-9)

View this book on SpringerLink

Extra Materials File 978-81-322-2508-9